Objective EC Epiplan 5x/0.13 M27
Objective EC Epiplan 5x/0.13 M27
Item no.: 422030-9902-000Objective EC Epiplan 5x/0.13 M27 (FWD=11.8mm)
Full DescriptionMagnification | 5x |
Numerical Aperture | 0.13 |
Free Working Distance [mm] | 11.8 |
Coverglass Thickness [mm] | 0 |
Thread Type | M27x0.75 |
Immersion | Without Immersion |
Field of View [mm] | 23 |
Parfocal Length [mm] | 45.00 |
Long Distance | |
Correction Ring | |
Iris | |
Optical System | Infinity Color Corrected System (ICS) |
Color Correction | achromatic |
Biomedical Applications | |
---|---|
Fluorescence | |
- Multichannel | |
- Ultraviolet Transmission | |
- Infra Red Transmission | |
BrightField | |
DIC [Differential Interference Contrast] | |
High Contrast DIC | |
PlasDIC | |
Phase Contrast | |
VAREL Contrast | |
Hoffman Modulation Contrast | |
Polarization Contrast | |
Materials (Reflected Light) Applications | |
BrightField | |
BrightField/DarkField | |
Reflected Light DIC | |
High Contrast DIC | |
DIC with circular polarized light | |
Total Interference Contrast | |
Polarization Contrast | |
Options | |
Definite Focus.2 | |
Confocal Microscopy | |
- Ultra Violet | |
- VIS (visible light) | |
- NLO-IR / 2 Photon | |
Total Internal Reflection Fluorescence | |
Apotome | |
Microdissection |
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Objective ring ACR for objective sleeve cylindrical short
Item no.: 424508-0000-000Objective ring ACR for objective sleeve cylindrical short
Item no.: 424508-0000-000Objective ring ACR for objective sleeve cylindrical short
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DIC slider EC PN 10x/0.30 I, 20x/0.50 II, PA 20x/0.80 II
Item no.: 426940-0000-000DIC slider EC PN 10x/0.30 I, 20x/0.50 II, PA 20x/0.80 II
Item no.: 426940-0000-000DIC slider EC PN 10x/0.30 I, 20x/0.50 II, PA 20x/0.80 II
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DIC slider EC EP 5x/0.13; 10x/0.2; 20x/0.4 Epi+
Item no.: 426968-9100-000DIC slider EC EP 5x/0.13; 10x/0.2; 20x/0.4 Epi+
Item no.: 426968-9100-000DIC slider EC EP 5x/0.13; 10x/0.2; 20x/0.4 Epi+
Note:
All measures in [mm]
mech. Arbeitsabstand = mechanical working distance
Deckglas = cover glass
Objektebene = object plane
Objektfeld = object field
Ausleuchtung = illumination
Probenzugänglichkeit = specimen accessibility
Note:
Please note that due to production tolerances, the given values are typical only and not guaranteed.
Enhanced Contrast Universal objectives for materials microscopy allowing brightfield, differential interference contrast and polarization methods. HD versions provide darkfield capability in addition. They feature the long working distances needed for materials inspections.
Objective EC Epiplan 5x/0.13 M27 (FWD=11.8mm)